TOF Technology
from.....
ALMSCO

 

BenchTOF-dx™

BenchTOF-dx

BenchTOF-dx™ offers a unique combination of high-performance & affordability  to any GCMS user interested in trace detection


BenchTOF-dx™ is a fast, high performance reflectron time-of-flight (TOF) mass spectrometer (MS) for analysing ultra-trace level volatile and semi-volatile organic chemicals in complex real-world samples. Novel architecture and proprietary noise reduction algorithms offer and unrivalled combination of:

  • Sensitivity
  • Compound resolution
  • Spectral quality, and
  • Robust operation

All clear advantages for trace analysis

 
BenchTOD-dx

BenchTOF-dx™ Main Features

  • State-of-the-art ion optics & direct extraction technology maximise sensitivity. Full scan data at quadrupole SIM sensitivity levels (>800:1 s/n for 1 pg OFN while scanning over full mass range with DBC)
  • Enhanced detection of trace target analytes
  • High speed spectral acquisition (10,000 Hz) for compatibility with fast GC, GCxGC (2D GC) and complex conventional GC profiles. 100 "scansets" written to disc every second.
  • Mass range of 1 to 1000 amu, with mass resolution of 1000, ensures compatibility with every GC application
  • 0.01 amu spectral display for 12C/13C isotope resolution
  • Long-term mass & detector-response stability reduces tuning/calibration frequency and optimises system productivity
  • Uniquely powerful noise reduction software minimises requirement for manual data manipulation
  • Integrates with existing third-party GCMS data analysis software to minimise operator learning curve or uses own comprehensive data processing software package
  • Optimum versatility: Compatible with any make of GC and a wide range of hyphenated techniques
  • Low cost, compact technology that operates in standard laboratory environments ensuing fast return on investment

Enhanced sensitivity with direct extraction (dx)

BenchTOF-dx

In quadrupole MS instruments only a proportion of the ions produced in the ion sourse actually reach the detector because the technology utilises a mass filter which only allows on mass ion through the detector at a time. This reduces sensitivity.

 

In TOF MS all the ions entering the flight tube reach the detector without filtering. The result is greater sensitivity; the same sensitivity in full scan mode as afforded by quadrupoles in single ion monitoring (SIM) mode.

In traditional TOF design this theoretical sensitivity is not reach because of fhte manner in which ions are extracted from the ion source (orthogonal extraction).

 

Using innovative ion optics, BenchTOF-dx dispenses with the othogonal extraction of ions and adopts a cutting-edge and highly effective direct extraction (dx) approach. Ions are directly extracted from the ion source and transferred to the flight tube with minimal loss. The result is enhanced sensitivity over other TOF instruments using orthogonal extraction

OFN

BenchTOF-dx: Robust answer for demanding GCMS applications

Maximum uptime and productivity is ensured by:

 

  • Mass ion stability: Unaffected by diurnal temperature variations and other factors
  • Linear for 4 orders of magnitude which reduces error and minimises calibration frequency
  • Robust mechanical design with easy component access for routine maintenance
  • Comprehensive yet intuitive control software
  • Automation of key system control parameters (e.g. detector optimisation)
Scansets

Interfaces with most brands of GC & with existing GCMS software

dx-connect

BenchTOF-dx offers the option of using its own comprehensive data analysis software (dx-View™) or integration with the data analysis systems of major brands of GCMS via dx-Connect™

 

 

 

Compatible third-party GCMS analysis options include:

 

  • Agilent Technologies ChemStation
  • Thermo Fisher XCalibur®, and
  • Shimadzu GCMS solutions

 

dx-Connect offers:

 

  • Real-time data view capability
  • Synchronisation with the GC sequence
  • Flexible data format out options

 

Using BenchTOF-dx and the dx-Connect facility, GC parameters and analytical sequence developments are all set up and controlled using the appropriate existing software in the same way as other GCMS systems in the laboratory.

 

dx-View

 

dx-View is the proprietary data processing software package for BenchTOF-dx.  It can be used as an alternative to third-party GCMS data processing packages.

Dynamic Background Compensation (DBC): Uniquely powerful background elimination - operates automatically & in real-time

DBC is an innovative real-time data processing algorithm implemented as standard on BenchTOF-dx. It uses an innovative mathemetical approach to distinguish and eliminate background interference from real chromatographic peaks, even at the lowest levels. It accomodates conventional and high-speed GC and is a dynamic process, compensating for the chromatographic background as it changes throughout a run, but without compromising any peak-related information.

 

Two files are written, one with DBC data and other other of non-DBC data.  A generic, stand-alone version of the BenchTOF-dx DBC facility allowing users to apply the advantages of DBC to other standard GCMS systems in the laboratory network is called ClearView. Further information on ClearView can be found here.

 

Quantitation
By selectively eliminating interfering background ions DBC also simplifies integration, improving both quantitative accuracy and run-to-run reproducibility.

Dynamic Background Compensation (DBC)

Related Products

ClearView GCMS reprocessing software

 

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